TenuPol-5

With TenuPol-5 a perforated specimen for transmission electron microscopy can be made from a sample of 3 or 2.3 mm dia. in just a few minutes.
The specimen is polished from both sides simultaneously, thus providing a structure with a minimum of deformation. When the perforation appears, the polishing can automatically be stopped by the infrared detector system, and the specimen is ready for the TEM examination. No special operator training is re quired.